{
  "slug": "metallic-grains-decohere-superconducting-circuits-715252",
  "title": "Metallic Grains Decohere Superconducting Circuits",
  "dek": "Scanning gate microscopy on live superconducting circuits links decoherence to Coulomb blockade and microwave-driven charge tunnelling in metallic grains.",
  "summary": "Metallic grains may drive superconducting-circuit decoherence via Coulomb blockade and charge tunnelling, challenging TLS-only diagnoses.",
  "tags": [
    "superconducting-circuits",
    "decoherence",
    "metallic-grains",
    "coulomb-blockade",
    "microwave-driven-charge-tunnelling",
    "TLS-defects",
    "scanning-gate-microscopy",
    "quantum-hardware",
    "thin-film-fabrication"
  ],
  "published_at": "2026-07-18T16:03:48.843+00:00",
  "grade": 8.3,
  "agent_utility": 8.2,
  "price_usdc": 0.241,
  "stats": {
    "claims": 13,
    "entities": 18,
    "faq": 8,
    "downloads": 0,
    "paid_downloads": 0
  },
  "preview": {
    "faq_questions": [
      "What new decoherence mechanism is reported?",
      "How was the mechanism identified?",
      "Why are metallic grains important for fabricated quantum devices?",
      "Are metallic-grain defects worse than TLS defects?",
      "Why might conventional characterization miss or mislabel this loss?",
      "What mitigation does the abstract propose?",
      "Does the abstract report numerical performance results?",
      "Can this abstract alone define a fabrication recipe?"
    ],
    "entity_names": [
      {
        "name": "Solid-state quantum devices",
        "type": "hardware class"
      },
      {
        "name": "Superconducting circuits",
        "type": "hardware"
      },
      {
        "name": "Microwave-based solid-state quantum devices",
        "type": "hardware class"
      },
      {
        "name": "Thin-film devices",
        "type": "hardware class"
      },
      {
        "name": "Standard lithography processes",
        "type": "fabrication process"
      },
      {
        "name": "Scanning gate microscopy",
        "type": "measurement technique"
      },
      {
        "name": "Live superconducting circuits",
        "type": "experimental system"
      },
      {
        "name": "Metallic grains",
        "type": "material defect"
      },
      {
        "name": "Coulomb blockade",
        "type": "physical mechanism"
      },
      {
        "name": "Microwave-driven charge tunnelling",
        "type": "physical mechanism"
      },
      {
        "name": "Two-level system defects",
        "type": "defect class"
      },
      {
        "name": "Uncontrolled surfaces",
        "type": "material feature"
      },
      {
        "name": "Interfaces",
        "type": "material feature"
      },
      {
        "name": "Structural imperfections",
        "type": "material feature"
      },
      {
        "name": "Conventional characterisation techniques",
        "type": "diagnostic category"
      },
      {
        "name": "Microwave power-independent processes",
        "type": "loss-category descriptor"
      },
      {
        "name": "Coherence lifetimes",
        "type": "performance metric"
      },
      {
        "name": "Noise",
        "type": "device behavior"
      }
    ],
    "related_work_titles": [
      "TLS-defect literature as external background, not specifically cited here",
      "Materials-origin decoherence studies as external background, not specifically cited here",
      "Scanning-gate microscopy studies as external background, not specifically cited here",
      "Thin-film fabrication and lithography literature as external background, not specifically cited here"
    ],
    "application_industries": [
      "Quantum computing hardware",
      "Thin-film quantum-device fabrication",
      "Quantum device diagnostics",
      "Cryogenic microwave engineering",
      "Materials characterization"
    ],
    "glossary_terms": [
      "Decoherence",
      "Coulomb blockade",
      "Microwave-driven charge tunnelling",
      "Metallic grain",
      "Two-level system defect",
      "Scanning gate microscopy",
      "Live superconducting circuit",
      "Thin-film device",
      "Lithography",
      "Microwave loss",
      "Microwave power-independent process",
      "Coherence lifetime"
    ]
  },
  "purchase": {
    "protocol": "x402",
    "version": 2,
    "network": "eip155:8453",
    "asset": "USDC",
    "price": 0.241,
    "full_markdown_url": "https://x402.disruptive-concepts.com/api/public/article/metallic-grains-decohere-superconducting-circuits-715252/full",
    "full_json_url": "https://x402.disruptive-concepts.com/api/public/article/metallic-grains-decohere-superconducting-circuits-715252/full?format=json"
  }
}